afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Sullivan, Nicholas J., Valdés, Julio J., Bevan, Kirk H., Grutter, Peter
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Materials Science Software Engineering
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2509.00113