Generative AI for Industrial Contour Detection: A Language-Guided Vision System
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arXiv
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| Autori principali: | , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866914014428135424 |
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| author | Gong, Liang Tommy Wang Chaker, Sara Dong, Yanchen Bousetouane, Fouad Morton, Brenden Mendez, Mark |
| author_facet | Gong, Liang Tommy Wang Chaker, Sara Dong, Yanchen Bousetouane, Fouad Morton, Brenden Mendez, Mark |
| contents | Industrial computer vision systems often struggle with noise, material variability, and uncontrolled imaging conditions, limiting the effectiveness of classical edge detectors and handcrafted pipelines. In this work, we present a language-guided generative vision system for remnant contour detection in manufacturing, designed to achieve CAD-level precision. The system is organized into three stages: data acquisition and preprocessing, contour generation using a conditional GAN, and multimodal contour refinement through vision-language modeling, where standardized prompts are crafted in a human-in-the-loop process and applied through image-text guided synthesis. On proprietary FabTrack datasets, the proposed system improved contour fidelity, enhancing edge continuity and geometric alignment while reducing manual tracing. For the refinement stage, we benchmarked several vision-language models, including Google's Gemini 2.0 Flash, OpenAI's GPT-image-1 integrated within a VLM-guided workflow, and open-source baselines. Under standardized conditions, GPT-image-1 consistently outperformed Gemini 2.0 Flash in both structural accuracy and perceptual quality. These findings demonstrate the promise of VLM-guided generative workflows for advancing industrial computer vision beyond the limitations of classical pipelines. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_00284 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Generative AI for Industrial Contour Detection: A Language-Guided Vision System Gong, Liang Tommy Wang Chaker, Sara Dong, Yanchen Bousetouane, Fouad Morton, Brenden Mendez, Mark Computer Vision and Pattern Recognition Artificial Intelligence Industrial computer vision systems often struggle with noise, material variability, and uncontrolled imaging conditions, limiting the effectiveness of classical edge detectors and handcrafted pipelines. In this work, we present a language-guided generative vision system for remnant contour detection in manufacturing, designed to achieve CAD-level precision. The system is organized into three stages: data acquisition and preprocessing, contour generation using a conditional GAN, and multimodal contour refinement through vision-language modeling, where standardized prompts are crafted in a human-in-the-loop process and applied through image-text guided synthesis. On proprietary FabTrack datasets, the proposed system improved contour fidelity, enhancing edge continuity and geometric alignment while reducing manual tracing. For the refinement stage, we benchmarked several vision-language models, including Google's Gemini 2.0 Flash, OpenAI's GPT-image-1 integrated within a VLM-guided workflow, and open-source baselines. Under standardized conditions, GPT-image-1 consistently outperformed Gemini 2.0 Flash in both structural accuracy and perceptual quality. These findings demonstrate the promise of VLM-guided generative workflows for advancing industrial computer vision beyond the limitations of classical pipelines. |
| title | Generative AI for Industrial Contour Detection: A Language-Guided Vision System |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence |
| url | https://arxiv.org/abs/2509.00284 |