"One defect, one potential" strategy for accurate machine learning prediction of defect phonons

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhou, Junjie, Li, Xinpeng, Huang, Menglin, Chen, Shiyou
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.00498