Development of Solar Flare X-ray Polarimeter with Micro-Pixel CMOS Sensors
Fuente:
arXiv
Salvato in:
| Autori principali: | , , , , , , , , , , , , |
|---|---|
| Natura: | Preprint |
| Pubblicazione: |
2025
|
| Soggetti: | |
| Accesso online: | |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
| _version_ | 1866912570096484352 |
|---|---|
| author | Hagino, Kouichi Kato, Tatsuaki Iwata, Toshiya Ichihashi, Masahiro Matsuhashi, Hiroumi Fujimoto, Gen Sato, Riki Odaka, Hirokazu Narukage, Noriyuki Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya |
| author_facet | Hagino, Kouichi Kato, Tatsuaki Iwata, Toshiya Ichihashi, Masahiro Matsuhashi, Hiroumi Fujimoto, Gen Sato, Riki Odaka, Hirokazu Narukage, Noriyuki Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya |
| contents | We are developing an X-ray polarimeter using micro-pixel CMOS sensors for solar flare X-ray polarimetry. The system consists of a 2.5-$μ$m pixel CMOS image sensor with a 12.8$\times$12.8 mm$^2$ imaging area and a readout system based on a Zynq System-on-Chip. While previous studies have validated this concept, no realistic feasibility studies have been conducted for the solar flare X-ray polarization observation. In this work, we performed polarization sensitivity measurements at synchrotron facilities. The results show that our polarimeter is sensitive to the X-ray polarization, exhibiting a modulation factor of 5-15% at an energy range of 6-22 keV. The measurements also determined the thickness of the sensitive layer to be approximately 5 $μ$m, and the thicknesses of the insensitive layers to be 0.8 $μ$m (Si), 2.1 $μ$m (SiO2), and 0.24 $μ$m (Cu). These measured thicknesses lead to a quantum efficiency of 3-4% at 10 keV. Based on these experimental evaluations, we estimated the sensitivity of the micro-pixel CMOS polarimeter system. We found that, when combined with a telescope with an effective area of $\sim$10 cm$^2$, this system can detect X-ray polarization with a polarization degree of a few percent for M-class flares. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_03914 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Development of Solar Flare X-ray Polarimeter with Micro-Pixel CMOS Sensors Hagino, Kouichi Kato, Tatsuaki Iwata, Toshiya Ichihashi, Masahiro Matsuhashi, Hiroumi Fujimoto, Gen Sato, Riki Odaka, Hirokazu Narukage, Noriyuki Arai, Shota Minami, Takahiro Takashima, Satoshi Bamba, Aya Instrumentation and Methods for Astrophysics We are developing an X-ray polarimeter using micro-pixel CMOS sensors for solar flare X-ray polarimetry. The system consists of a 2.5-$μ$m pixel CMOS image sensor with a 12.8$\times$12.8 mm$^2$ imaging area and a readout system based on a Zynq System-on-Chip. While previous studies have validated this concept, no realistic feasibility studies have been conducted for the solar flare X-ray polarization observation. In this work, we performed polarization sensitivity measurements at synchrotron facilities. The results show that our polarimeter is sensitive to the X-ray polarization, exhibiting a modulation factor of 5-15% at an energy range of 6-22 keV. The measurements also determined the thickness of the sensitive layer to be approximately 5 $μ$m, and the thicknesses of the insensitive layers to be 0.8 $μ$m (Si), 2.1 $μ$m (SiO2), and 0.24 $μ$m (Cu). These measured thicknesses lead to a quantum efficiency of 3-4% at 10 keV. Based on these experimental evaluations, we estimated the sensitivity of the micro-pixel CMOS polarimeter system. We found that, when combined with a telescope with an effective area of $\sim$10 cm$^2$, this system can detect X-ray polarization with a polarization degree of a few percent for M-class flares. |
| title | Development of Solar Flare X-ray Polarimeter with Micro-Pixel CMOS Sensors |
| topic | Instrumentation and Methods for Astrophysics |
| url | https://arxiv.org/abs/2509.03914 |