Sticker-TTS: Learn to Utilize Historical Experience with a Sticker-driven Test-Time Scaling Framework

Fuente: arXiv
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Main Authors: Chen, Jie, Jiang, Jinhao, Min, Yingqian, Dong, Zican, Wang, Shijie, Zhao, Wayne Xin, Wen, Ji-Rong
Format: Preprint
Published: 2025
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author Chen, Jie
Jiang, Jinhao
Min, Yingqian
Dong, Zican
Wang, Shijie
Zhao, Wayne Xin
Wen, Ji-Rong
author_facet Chen, Jie
Jiang, Jinhao
Min, Yingqian
Dong, Zican
Wang, Shijie
Zhao, Wayne Xin
Wen, Ji-Rong
contents Large reasoning models (LRMs) have exhibited strong performance on complex reasoning tasks, with further gains achievable through increased computational budgets at inference. However, current test-time scaling methods predominantly rely on redundant sampling, ignoring the historical experience utilization, thereby limiting computational efficiency. To overcome this limitation, we propose Sticker-TTS, a novel test-time scaling framework that coordinates three collaborative LRMs to iteratively explore and refine solutions guided by historical attempts. At the core of our framework are distilled key conditions-termed stickers-which drive the extraction, refinement, and reuse of critical information across multiple rounds of reasoning. To further enhance the efficiency and performance of our framework, we introduce a two-stage optimization strategy that combines imitation learning with self-improvement, enabling progressive refinement. Extensive evaluations on three challenging mathematical reasoning benchmarks, including AIME-24, AIME-25, and OlymMATH, demonstrate that Sticker-TTS consistently surpasses strong baselines, including self-consistency and advanced reinforcement learning approaches, under comparable inference budgets. These results highlight the effectiveness of sticker-guided historical experience utilization. Our code and data are available at https://github.com/RUCAIBox/Sticker-TTS.
format Preprint
id arxiv_https___arxiv_org_abs_2509_05007
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Sticker-TTS: Learn to Utilize Historical Experience with a Sticker-driven Test-Time Scaling Framework
Chen, Jie
Jiang, Jinhao
Min, Yingqian
Dong, Zican
Wang, Shijie
Zhao, Wayne Xin
Wen, Ji-Rong
Artificial Intelligence
Computation and Language
I.2.7
Large reasoning models (LRMs) have exhibited strong performance on complex reasoning tasks, with further gains achievable through increased computational budgets at inference. However, current test-time scaling methods predominantly rely on redundant sampling, ignoring the historical experience utilization, thereby limiting computational efficiency. To overcome this limitation, we propose Sticker-TTS, a novel test-time scaling framework that coordinates three collaborative LRMs to iteratively explore and refine solutions guided by historical attempts. At the core of our framework are distilled key conditions-termed stickers-which drive the extraction, refinement, and reuse of critical information across multiple rounds of reasoning. To further enhance the efficiency and performance of our framework, we introduce a two-stage optimization strategy that combines imitation learning with self-improvement, enabling progressive refinement. Extensive evaluations on three challenging mathematical reasoning benchmarks, including AIME-24, AIME-25, and OlymMATH, demonstrate that Sticker-TTS consistently surpasses strong baselines, including self-consistency and advanced reinforcement learning approaches, under comparable inference budgets. These results highlight the effectiveness of sticker-guided historical experience utilization. Our code and data are available at https://github.com/RUCAIBox/Sticker-TTS.
title Sticker-TTS: Learn to Utilize Historical Experience with a Sticker-driven Test-Time Scaling Framework
topic Artificial Intelligence
Computation and Language
I.2.7
url https://arxiv.org/abs/2509.05007