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Depth Profiling of Oxygen Migration in Ta/HfO2 Stacks During Ionic Liquid Gating

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bednarz, Beatrice, Wortmann, Martin, Kuschel, Olga, Kammerbauer, Fabian, Kläui, Mathias, Hütten, Andreas, Wollschläger, Joachim, Jakob, Gerhard, Kuschel, Timo
Format:	Preprint
Published:	2025
Subjects:	Materials Science Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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