Dual-Mode Deep Anomaly Detection for Medical Manufacturing: Structural Similarity and Feature Distance

Fuente: arXiv

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Bibliographic Details
Main Authors:	Diaz, Julio Zanon, Siogkas, Georgios, Corcoran, Peter
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.05796