3D Mapping of Defects and Moiré Corrugations via Electron Ptychography Atomic Coordinate Retrieval

Fuente: arXiv
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Bibliographic Details
Main Authors: Huang, Jeffrey, Zhang, Yichao, Bae, Sang hyun, Ahammed, Ballal, Ertekin, Elif, Huang, Pinshane Y.
Format: Preprint
Published: 2025
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