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3D Mapping of Defects and Moiré Corrugations via Electron Ptychography Atomic Coordinate Retrieval

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Huang, Jeffrey, Zhang, Yichao, Bae, Sang hyun, Ahammed, Ballal, Ertekin, Elif, Huang, Pinshane Y.
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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