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Autores principales: Anker, Benjamin, Marvian, Milad
Formato: Preprint
Publicado: 2025
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Acceso en línea:https://arxiv.org/abs/2509.07288
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author Anker, Benjamin
Marvian, Milad
author_facet Anker, Benjamin
Marvian, Milad
contents In this work, we analyze a framework for constructing fault-tolerant measurement schedules of varying lengths by combining stabilizer generators, and prove results about the distance of such schedules by combining according to classical codes. Using this framework, we produce explicit measurement schedules sufficient for fault-tolerant error correction of quantum codes of distance $d$ with $r$ independent stabilizer generators using only $O(d \log{r})$ measurements if the code is LDPC, and $O(d \log d \log r)$ measurements if the code is produced via concatenating a smaller code with itself $O(\log d)$ times. In both of these cases the number of measurements can be asymptotically fewer than the number of stabilizer generators which define the code. Although optimizing our construction to use the fewest measurements produces high-weight stabilizers, we also show that we can reduce the number of measurements used for specific examples while maintaining low-weight stabilizer measurements. We numerically examine the performance of our construction on the surface code under several noise models and demonstrate the exponential error suppression with increasing distance which is characteristic of weak fault tolerance.
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publishDate 2025
record_format arxiv
spellingShingle Compressing Syndrome Measurement Sequences
Anker, Benjamin
Marvian, Milad
Quantum Physics
In this work, we analyze a framework for constructing fault-tolerant measurement schedules of varying lengths by combining stabilizer generators, and prove results about the distance of such schedules by combining according to classical codes. Using this framework, we produce explicit measurement schedules sufficient for fault-tolerant error correction of quantum codes of distance $d$ with $r$ independent stabilizer generators using only $O(d \log{r})$ measurements if the code is LDPC, and $O(d \log d \log r)$ measurements if the code is produced via concatenating a smaller code with itself $O(\log d)$ times. In both of these cases the number of measurements can be asymptotically fewer than the number of stabilizer generators which define the code. Although optimizing our construction to use the fewest measurements produces high-weight stabilizers, we also show that we can reduce the number of measurements used for specific examples while maintaining low-weight stabilizer measurements. We numerically examine the performance of our construction on the surface code under several noise models and demonstrate the exponential error suppression with increasing distance which is characteristic of weak fault tolerance.
title Compressing Syndrome Measurement Sequences
topic Quantum Physics
url https://arxiv.org/abs/2509.07288