High-current p-type transistors from precursor-engineered synthetic monolayer WSe$_2$

Fuente: arXiv
Guardado en:
Detalles Bibliográficos
Autores principales: Hoang, Anh Tuan, Neilson, Kathryn, Xu, Kaikui, Yang, Yucheng, Ribet, Stephanie M., Peña, Tara, D'Acunto, Giulio, Song, Young Suh, Persson, Anton E. O., Millsaps, William, Ophus, Colin, Rosenberger, Matthew R., Pop, Eric, Mannix, Andrew J.
Formato: Preprint
Publicado: 2025
Materias:
Acceso en línea:
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
_version_ 1866912578028961792
author Hoang, Anh Tuan
Neilson, Kathryn
Xu, Kaikui
Yang, Yucheng
Ribet, Stephanie M.
Peña, Tara
D'Acunto, Giulio
Song, Young Suh
Persson, Anton E. O.
Millsaps, William
Ophus, Colin
Rosenberger, Matthew R.
Pop, Eric
Mannix, Andrew J.
author_facet Hoang, Anh Tuan
Neilson, Kathryn
Xu, Kaikui
Yang, Yucheng
Ribet, Stephanie M.
Peña, Tara
D'Acunto, Giulio
Song, Young Suh
Persson, Anton E. O.
Millsaps, William
Ophus, Colin
Rosenberger, Matthew R.
Pop, Eric
Mannix, Andrew J.
contents Monolayer tungsten diselenide (WSe$_2$) is a leading candidate for nanoscale complementary logic. However, high defect densities introduced during thin-film growth and device fabrication have limited p-type transistor performance. Here, we report a combined strategy of precursor-engineered chemical vapor deposition and damage-minimizing fabrication to overcome this limitation. By converting tungsten trioxide and residual oxyselenides into reactive suboxides before growth, and precisely regulating selenium delivery during deposition, we synthesize uniform, centimeter-scale monolayer WSe$_2$ films with charged defect densities as low as $5 \times 10^{9}$ cm$^{-2}$. Transistors fabricated from these films achieve record p-type on-state current up to $888 μ$A$\cdotμ$m$^{-1}$ at $V_{\mathrm{DS}}=-1$ V, matching leading n-type devices. This leap in material quality closes the p-type performance gap without exotic doping or contact materials, marking a critical step towards complementary two-dimensional semiconductor circuits.
format Preprint
id arxiv_https___arxiv_org_abs_2509_07299
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle High-current p-type transistors from precursor-engineered synthetic monolayer WSe$_2$
Hoang, Anh Tuan
Neilson, Kathryn
Xu, Kaikui
Yang, Yucheng
Ribet, Stephanie M.
Peña, Tara
D'Acunto, Giulio
Song, Young Suh
Persson, Anton E. O.
Millsaps, William
Ophus, Colin
Rosenberger, Matthew R.
Pop, Eric
Mannix, Andrew J.
Materials Science
Mesoscale and Nanoscale Physics
Monolayer tungsten diselenide (WSe$_2$) is a leading candidate for nanoscale complementary logic. However, high defect densities introduced during thin-film growth and device fabrication have limited p-type transistor performance. Here, we report a combined strategy of precursor-engineered chemical vapor deposition and damage-minimizing fabrication to overcome this limitation. By converting tungsten trioxide and residual oxyselenides into reactive suboxides before growth, and precisely regulating selenium delivery during deposition, we synthesize uniform, centimeter-scale monolayer WSe$_2$ films with charged defect densities as low as $5 \times 10^{9}$ cm$^{-2}$. Transistors fabricated from these films achieve record p-type on-state current up to $888 μ$A$\cdotμ$m$^{-1}$ at $V_{\mathrm{DS}}=-1$ V, matching leading n-type devices. This leap in material quality closes the p-type performance gap without exotic doping or contact materials, marking a critical step towards complementary two-dimensional semiconductor circuits.
title High-current p-type transistors from precursor-engineered synthetic monolayer WSe$_2$
topic Materials Science
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2509.07299