Salvato in:
Dettagli Bibliografici
Autori principali: Nayak, Sanjay, Andrianov, Nikolai, Gruhn, Thomas, Miranda, Joaquin
Natura: Preprint
Pubblicazione: 2025
Soggetti:
Accesso online:https://arxiv.org/abs/2509.07554
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
_version_ 1866915486357258240
author Nayak, Sanjay
Andrianov, Nikolai
Gruhn, Thomas
Miranda, Joaquin
author_facet Nayak, Sanjay
Andrianov, Nikolai
Gruhn, Thomas
Miranda, Joaquin
contents Using first-principles density functional theory calculations in combination with the climbing-image nudged elastic band method, we investigated the adsorption, desorption, and diffusion of atomic chlorine and molecular chlorine on the Al terminated 0001 surface of aluminum nitride. Our results reveal that both atomic Cl and Cl2 exhibit a chemisorption character with high binding energies. Calculations revealed that the splitting pathway of Cl2 on the Al terminated AlN 0001 surface is a barrierless and exothermic process. These findings provide new microscopic-scale insights into halogen-insulator surface interactions and opportunities for new strategies in optimizing AlN atomic layer etching process in semiconductor fabrication.
format Preprint
id arxiv_https___arxiv_org_abs_2509_07554
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Atomic Layer Etching of Aluminum Nitride: Mechanistic Insights from First-Principles Studies of Chlorine Chemistry
Nayak, Sanjay
Andrianov, Nikolai
Gruhn, Thomas
Miranda, Joaquin
Materials Science
Using first-principles density functional theory calculations in combination with the climbing-image nudged elastic band method, we investigated the adsorption, desorption, and diffusion of atomic chlorine and molecular chlorine on the Al terminated 0001 surface of aluminum nitride. Our results reveal that both atomic Cl and Cl2 exhibit a chemisorption character with high binding energies. Calculations revealed that the splitting pathway of Cl2 on the Al terminated AlN 0001 surface is a barrierless and exothermic process. These findings provide new microscopic-scale insights into halogen-insulator surface interactions and opportunities for new strategies in optimizing AlN atomic layer etching process in semiconductor fabrication.
title Atomic Layer Etching of Aluminum Nitride: Mechanistic Insights from First-Principles Studies of Chlorine Chemistry
topic Materials Science
url https://arxiv.org/abs/2509.07554