Temperature Dependence of Gain and Time Resolution in LGAD Detectors

Fuente: arXiv
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Main Authors: Sun, Weiyi, Li, Mengzhao, Zhao, Mei, Liang, Zhijun
Format: Preprint
Published: 2025
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author Sun, Weiyi
Li, Mengzhao
Zhao, Mei
Liang, Zhijun
author_facet Sun, Weiyi
Li, Mengzhao
Zhao, Mei
Liang, Zhijun
contents Low-Gain Avalanche Diodes (LGADs) provide moderate internal gain and time resolutions of a few tens of picoseconds, making them a key technology for ultrafast timing in high-energy physics and beyond. However, both their gain and timing characteristics vary strongly with reverse-bias voltage and temperature. This work establishes a compact analytical framework that describes multi-temperature LGAD gain and timing behavior through an equivalent representation of the gain layer. The non-uniform multiplication region is replaced by an equivalent rectangular gain layer, from which a first-order bias-compensation relation for constant gain is derived and validated. Using multi-temperature measurements of LGADs designed by IHEP and fabricated by IME, together with an independent HPK dataset, we show that the gain-voltage curve family can be reconstructed from a reference-temperature main curve, substantially reducing characterization effort. The same idea is then extended to timing by decomposing the total time resolution into jitter and intrinsic components and representing their temperature dependences as component-wise equivalent bias offsets. The resulting framework provides a function-level description of multi-temperature LGAD time-resolution curves and offers a practical tool for calibration, operation, and reduced-density characterization of LGAD-based ultrafast timing systems.
format Preprint
id arxiv_https___arxiv_org_abs_2509_08406
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Temperature Dependence of Gain and Time Resolution in LGAD Detectors
Sun, Weiyi
Li, Mengzhao
Zhao, Mei
Liang, Zhijun
Instrumentation and Detectors
High Energy Physics - Experiment
Low-Gain Avalanche Diodes (LGADs) provide moderate internal gain and time resolutions of a few tens of picoseconds, making them a key technology for ultrafast timing in high-energy physics and beyond. However, both their gain and timing characteristics vary strongly with reverse-bias voltage and temperature. This work establishes a compact analytical framework that describes multi-temperature LGAD gain and timing behavior through an equivalent representation of the gain layer. The non-uniform multiplication region is replaced by an equivalent rectangular gain layer, from which a first-order bias-compensation relation for constant gain is derived and validated. Using multi-temperature measurements of LGADs designed by IHEP and fabricated by IME, together with an independent HPK dataset, we show that the gain-voltage curve family can be reconstructed from a reference-temperature main curve, substantially reducing characterization effort. The same idea is then extended to timing by decomposing the total time resolution into jitter and intrinsic components and representing their temperature dependences as component-wise equivalent bias offsets. The resulting framework provides a function-level description of multi-temperature LGAD time-resolution curves and offers a practical tool for calibration, operation, and reduced-density characterization of LGAD-based ultrafast timing systems.
title Temperature Dependence of Gain and Time Resolution in LGAD Detectors
topic Instrumentation and Detectors
High Energy Physics - Experiment
url https://arxiv.org/abs/2509.08406