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Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

Fuente: arXiv

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Bibliographische Detailangaben
Hauptverfasser:	Graet, J. Le, Secroun, A., Tourneur-Silvain, M., Gillard, W., Fourmanoit, N., Escoffier, S., Kajfasz, E., Kermiche, S., Kubik, B., Zoubian, J., Andreon, S., Baldi, M., Bardelli, S., Battaglia, P., Bonino, D., Branchini, E., Brescia, M., Brinchmann, J., Caillat, A., Camera, S., Capobianco, V., Carbone, C., Carretero, J., Casas, S., Castellano, M., Castignani, G., Cavuoti, S., Cimatti, A., Colodro-Conde, C., Congedo, G., Conselice, C. J., Conversi, L., Copin, Y., Courbin, F., Courtois, H. M., Da Silva, A., Dinis, J., Douspis, M., Dubath, F., Duncan, C. A. J., Dupac, X., Dusini, S., Ealet, A., Farina, M., Farrens, S., Faustini, F., Ferriol, S., Frailis, M., Franceschi, E., Galeotta, S., Gillis, B., Giocoli, C., Grupp, F., Haugan, S. V. H., Holmes, W., Hormuth, F., Hornstrup, A., Hudelot, P., Jahnke, K., Jhabvala, M., Kiessling, A., Kilbinger, M., Kohley, R., Kurki-Suonio, H., Lilje, P. B., Lindholm, V., Lloro, I., Mainetti, G., Maino, D., Maiorano, E., Mansutti, O., Marggraf, O., Markovic, K., Martinet, N., Marulli, F., Massey, R., Medinaceli, E., Mei, S., Meneghetti, M., Meylan, G., Moresco, M., Moscardini, L., Niemi, S. -M., Nightingale, J. W., Padilla, C., Paltani, S., Pasian, F., Pedersen, K., Pettorino, V., Pires, S., Polenta, G., Poncet, M., Popa, L. A., Raison, F., Renzi, A., Rhodes, J., Riccio, G., Romelli, E., Roncarelli, M., Rossetti, E., Saglia, R., Sapone, D., Sartoris, B., Schewtschenko, J. A., Schirmer, M., Seidel, G., Seiffert, M., Sirignano, C., Sirri, G., Stanco, L., Steinwagner, J., Tallada-Crespí, P., Tavagnacco, D., Taylor, A. N., Teplitz, H. I., Tereno, I., Toledo-Moreo, R., Torradeflot, F., Tutusaus, I., Valenziano, L., Vassallo, T., Veropalumbo, A., Wang, Y., Weller, J.
Format:	Preprint
Veröffentlicht:	2025
Schlagworte:	Instrumentation and Detectors Instrumentation and Methods for Astrophysics
Online-Zugang:	Acceder al recurso
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author	Graet, J. Le Secroun, A. Tourneur-Silvain, M. Gillard, W. Fourmanoit, N. Escoffier, S. Kajfasz, E. Kermiche, S. Kubik, B. Zoubian, J. Andreon, S. Baldi, M. Bardelli, S. Battaglia, P. Bonino, D. Branchini, E. Brescia, M. Brinchmann, J. Caillat, A. Camera, S. Capobianco, V. Carbone, C. Carretero, J. Casas, S. Castellano, M. Castignani, G. Cavuoti, S. Cimatti, A. Colodro-Conde, C. Congedo, G. Conselice, C. J. Conversi, L. Copin, Y. Courbin, F. Courtois, H. M. Da Silva, A. Dinis, J. Douspis, M. Dubath, F. Duncan, C. A. J. Dupac, X. Dusini, S. Ealet, A. Farina, M. Farrens, S. Faustini, F. Ferriol, S. Frailis, M. Franceschi, E. Galeotta, S. Gillis, B. Giocoli, C. Grupp, F. Haugan, S. V. H. Holmes, W. Hormuth, F. Hornstrup, A. Hudelot, P. Jahnke, K. Jhabvala, M. Kiessling, A. Kilbinger, M. Kohley, R. Kurki-Suonio, H. Lilje, P. B. Lindholm, V. Lloro, I. Mainetti, G. Maino, D. Maiorano, E. Mansutti, O. Marggraf, O. Markovic, K. Martinet, N. Marulli, F. Massey, R. Medinaceli, E. Mei, S. Meneghetti, M. Meylan, G. Moresco, M. Moscardini, L. Niemi, S. -M. Nightingale, J. W. Padilla, C. Paltani, S. Pasian, F. Pedersen, K. Pettorino, V. Pires, S. Polenta, G. Poncet, M. Popa, L. A. Raison, F. Renzi, A. Rhodes, J. Riccio, G. Romelli, E. Roncarelli, M. Rossetti, E. Saglia, R. Sapone, D. Sartoris, B. Schewtschenko, J. A. Schirmer, M. Seidel, G. Seiffert, M. Sirignano, C. Sirri, G. Stanco, L. Steinwagner, J. Tallada-Crespí, P. Tavagnacco, D. Taylor, A. N. Teplitz, H. I. Tereno, I. Toledo-Moreo, R. Torradeflot, F. Tutusaus, I. Valenziano, L. Vassallo, T. Veropalumbo, A. Wang, Y. Weller, J.
author_facet	Graet, J. Le Secroun, A. Tourneur-Silvain, M. Gillard, W. Fourmanoit, N. Escoffier, S. Kajfasz, E. Kermiche, S. Kubik, B. Zoubian, J. Andreon, S. Baldi, M. Bardelli, S. Battaglia, P. Bonino, D. Branchini, E. Brescia, M. Brinchmann, J. Caillat, A. Camera, S. Capobianco, V. Carbone, C. Carretero, J. Casas, S. Castellano, M. Castignani, G. Cavuoti, S. Cimatti, A. Colodro-Conde, C. Congedo, G. Conselice, C. J. Conversi, L. Copin, Y. Courbin, F. Courtois, H. M. Da Silva, A. Dinis, J. Douspis, M. Dubath, F. Duncan, C. A. J. Dupac, X. Dusini, S. Ealet, A. Farina, M. Farrens, S. Faustini, F. Ferriol, S. Frailis, M. Franceschi, E. Galeotta, S. Gillis, B. Giocoli, C. Grupp, F. Haugan, S. V. H. Holmes, W. Hormuth, F. Hornstrup, A. Hudelot, P. Jahnke, K. Jhabvala, M. Kiessling, A. Kilbinger, M. Kohley, R. Kurki-Suonio, H. Lilje, P. B. Lindholm, V. Lloro, I. Mainetti, G. Maino, D. Maiorano, E. Mansutti, O. Marggraf, O. Markovic, K. Martinet, N. Marulli, F. Massey, R. Medinaceli, E. Mei, S. Meneghetti, M. Meylan, G. Moresco, M. Moscardini, L. Niemi, S. -M. Nightingale, J. W. Padilla, C. Paltani, S. Pasian, F. Pedersen, K. Pettorino, V. Pires, S. Polenta, G. Poncet, M. Popa, L. A. Raison, F. Renzi, A. Rhodes, J. Riccio, G. Romelli, E. Roncarelli, M. Rossetti, E. Saglia, R. Sapone, D. Sartoris, B. Schewtschenko, J. A. Schirmer, M. Seidel, G. Seiffert, M. Sirignano, C. Sirri, G. Stanco, L. Steinwagner, J. Tallada-Crespí, P. Tavagnacco, D. Taylor, A. N. Teplitz, H. I. Tereno, I. Toledo-Moreo, R. Torradeflot, F. Tutusaus, I. Valenziano, L. Vassallo, T. Veropalumbo, A. Wang, Y. Weller, J.
contents	We introduce a fast method to measure the conversion gain in Complementary Metal-Oxide-Semiconductors (CMOS) Active Pixel Sensors (APS), which accounts for nonlinearity and interpixel capacitance (IPC). The standard 'mean-variance' method is biased because it assumes pixel values depend linearly on signal, and existing methods to correct for nonlinearity are still introducing significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to make an almost instantaneous calculation of gain. Validated using test data from a flight detector from the ESA Euclid mission, the IPC correction recovers the results of slower methods within 0.1% accuracy. Meanwhile the nonlinearity correction ensures an estimation of the gain that is independent of signal, correcting a bias of more than 2.5% on gain estimation.
format	Preprint
id	arxiv_https___arxiv_org_abs_2509_08810
institution	arXiv
publishDate	2025
record_format	arxiv
spellingShingle	Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS Graet, J. Le Secroun, A. Tourneur-Silvain, M. Gillard, W. Fourmanoit, N. Escoffier, S. Kajfasz, E. Kermiche, S. Kubik, B. Zoubian, J. Andreon, S. Baldi, M. Bardelli, S. Battaglia, P. Bonino, D. Branchini, E. Brescia, M. Brinchmann, J. Caillat, A. Camera, S. Capobianco, V. Carbone, C. Carretero, J. Casas, S. Castellano, M. Castignani, G. Cavuoti, S. Cimatti, A. Colodro-Conde, C. Congedo, G. Conselice, C. J. Conversi, L. Copin, Y. Courbin, F. Courtois, H. M. Da Silva, A. Dinis, J. Douspis, M. Dubath, F. Duncan, C. A. J. Dupac, X. Dusini, S. Ealet, A. Farina, M. Farrens, S. Faustini, F. Ferriol, S. Frailis, M. Franceschi, E. Galeotta, S. Gillis, B. Giocoli, C. Grupp, F. Haugan, S. V. H. Holmes, W. Hormuth, F. Hornstrup, A. Hudelot, P. Jahnke, K. Jhabvala, M. Kiessling, A. Kilbinger, M. Kohley, R. Kurki-Suonio, H. Lilje, P. B. Lindholm, V. Lloro, I. Mainetti, G. Maino, D. Maiorano, E. Mansutti, O. Marggraf, O. Markovic, K. Martinet, N. Marulli, F. Massey, R. Medinaceli, E. Mei, S. Meneghetti, M. Meylan, G. Moresco, M. Moscardini, L. Niemi, S. -M. Nightingale, J. W. Padilla, C. Paltani, S. Pasian, F. Pedersen, K. Pettorino, V. Pires, S. Polenta, G. Poncet, M. Popa, L. A. Raison, F. Renzi, A. Rhodes, J. Riccio, G. Romelli, E. Roncarelli, M. Rossetti, E. Saglia, R. Sapone, D. Sartoris, B. Schewtschenko, J. A. Schirmer, M. Seidel, G. Seiffert, M. Sirignano, C. Sirri, G. Stanco, L. Steinwagner, J. Tallada-Crespí, P. Tavagnacco, D. Taylor, A. N. Teplitz, H. I. Tereno, I. Toledo-Moreo, R. Torradeflot, F. Tutusaus, I. Valenziano, L. Vassallo, T. Veropalumbo, A. Wang, Y. Weller, J. Instrumentation and Detectors Instrumentation and Methods for Astrophysics We introduce a fast method to measure the conversion gain in Complementary Metal-Oxide-Semiconductors (CMOS) Active Pixel Sensors (APS), which accounts for nonlinearity and interpixel capacitance (IPC). The standard 'mean-variance' method is biased because it assumes pixel values depend linearly on signal, and existing methods to correct for nonlinearity are still introducing significant biases. While current IPC correction methods are prohibitively slow for a per-pixel application, our new method uses separate measurements of the IPC kernel to make an almost instantaneous calculation of gain. Validated using test data from a flight detector from the ESA Euclid mission, the IPC correction recovers the results of slower methods within 0.1% accuracy. Meanwhile the nonlinearity correction ensures an estimation of the gain that is independent of signal, correcting a bias of more than 2.5% on gain estimation.
title	Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS
topic	Instrumentation and Detectors Instrumentation and Methods for Astrophysics
url	https://arxiv.org/abs/2509.08810