Application of Machine Learning for Correcting Defect-induced Neuromorphic Circuit Inference Errors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sawal, Vedant, Wong, Hiu Yung
Format:	Preprint
Published:	2025
Subjects:	Neural and Evolutionary Computing Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.11113