Stacked Intelligent Metasurface for End-to-End OFDM System

Fuente: arXiv
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Autori principali: Zhang, Yida, Liu, Qiuyan, Luo, Hongtao, Xia, Yuqi, Wang, Qiang, Li, Fuchang, Tao, Xiaofeng, Liu, Yuanwei
Natura: Preprint
Pubblicazione: 2025
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author Zhang, Yida
Liu, Qiuyan
Luo, Hongtao
Xia, Yuqi
Wang, Qiang
Li, Fuchang
Tao, Xiaofeng
Liu, Yuanwei
author_facet Zhang, Yida
Liu, Qiuyan
Luo, Hongtao
Xia, Yuqi
Wang, Qiang
Li, Fuchang
Tao, Xiaofeng
Liu, Yuanwei
contents Stacked intelligent metasurface (SIM) and dual-polarized SIM (DPSIM) enabled wave-domain signal processing have emerged as promising research directions for offloading baseband digital processing tasks and efficiently simplifying transceiver design. However, existing architectures are limited to employing SIM (DPSIM) for a single communication function, such as precoding or combining. To further enhance the overall performance of SIM (DPSIM)-assisted systems and achieve end-to-end (E2E) joint optimization from the transmitted bitstream to the received bitstream, we propose an SIM (DPSIM)-assisted E2E orthogonal frequency division multiplexing (OFDM) system, in which traditional communication tasks such as channel coding, modulation, precoding, combining, demodulation, and channel decoding are performed synchronously within the electromagnetic (EM) forward propagation. Furthermore, inspired by the idea of abstracting real metasurfaces as hidden layers of a neural network, we propose the EM neural network (EMNN) to enable the control of the E2E OFDM communication system. In addition, transfer learning is introduced into the model training, and a training and deployment framework for the EMNN is designed. Simulation results demonstrate that both SIM-assisted E2E OFDM systems and DPSIM-assisted E2E OFDM systems can achieve robust bitstream transmission under complex channel conditions. Our study highlights the application potential of EMNN and SIM (DPSIM)-assisted E2E OFDM systems in the design of next-generation transceivers.
format Preprint
id arxiv_https___arxiv_org_abs_2509_11551
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Stacked Intelligent Metasurface for End-to-End OFDM System
Zhang, Yida
Liu, Qiuyan
Luo, Hongtao
Xia, Yuqi
Wang, Qiang
Li, Fuchang
Tao, Xiaofeng
Liu, Yuanwei
Signal Processing
Stacked intelligent metasurface (SIM) and dual-polarized SIM (DPSIM) enabled wave-domain signal processing have emerged as promising research directions for offloading baseband digital processing tasks and efficiently simplifying transceiver design. However, existing architectures are limited to employing SIM (DPSIM) for a single communication function, such as precoding or combining. To further enhance the overall performance of SIM (DPSIM)-assisted systems and achieve end-to-end (E2E) joint optimization from the transmitted bitstream to the received bitstream, we propose an SIM (DPSIM)-assisted E2E orthogonal frequency division multiplexing (OFDM) system, in which traditional communication tasks such as channel coding, modulation, precoding, combining, demodulation, and channel decoding are performed synchronously within the electromagnetic (EM) forward propagation. Furthermore, inspired by the idea of abstracting real metasurfaces as hidden layers of a neural network, we propose the EM neural network (EMNN) to enable the control of the E2E OFDM communication system. In addition, transfer learning is introduced into the model training, and a training and deployment framework for the EMNN is designed. Simulation results demonstrate that both SIM-assisted E2E OFDM systems and DPSIM-assisted E2E OFDM systems can achieve robust bitstream transmission under complex channel conditions. Our study highlights the application potential of EMNN and SIM (DPSIM)-assisted E2E OFDM systems in the design of next-generation transceivers.
title Stacked Intelligent Metasurface for End-to-End OFDM System
topic Signal Processing
url https://arxiv.org/abs/2509.11551