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Main Authors: Okamura, Hidekazu, Okazaki, Haruna, Marugaku, Katsunori, Lee, Subin, Yoneda, Tomoki, Udono, Haruhiko, Mori, Yoshihisa, Maesato, Mitsuhiko, Kitagawa, Hiroshi, Ikemoto, Yuka, Moriwaki, Taro
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2509.12559
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author Okamura, Hidekazu
Okazaki, Haruna
Marugaku, Katsunori
Lee, Subin
Yoneda, Tomoki
Udono, Haruhiko
Mori, Yoshihisa
Maesato, Mitsuhiko
Kitagawa, Hiroshi
Ikemoto, Yuka
Moriwaki, Taro
author_facet Okamura, Hidekazu
Okazaki, Haruna
Marugaku, Katsunori
Lee, Subin
Yoneda, Tomoki
Udono, Haruhiko
Mori, Yoshihisa
Maesato, Mitsuhiko
Kitagawa, Hiroshi
Ikemoto, Yuka
Moriwaki, Taro
contents In this article, a brief introduction is first given on infrared studies of materials at high pressures using a diamond anvil cell. Then, our recent results of high-pressure infrared studies are described for Mg$_2$Si, InAs, and InSb. For Mg$_2$Si, pressure-induced metallization at pressures near 10 GPa were clearly demonstrated for both carrier-doped and undoped Mg$_2$Si by large increases of reflectivity. For InAs and InSb, their band gap ($E_g$) increased rapidly and almost linearly with pressure with linear coefficients of $dE_g/dP$=84.6 and 112 meV/GPa, respectively. Obtained values of $E_g$ versus lattice parameter at high pressures are compared with those for other IIl-V semiconductors at ambient pressure, giving unique insight into effects of physical and chemical pressures on $E_g$. Above the structural transition pressures of 7 and 3 GPa for InAs and InSb, respectively, they exhibit highly metallic characteristics accompanied by high reflectivity.
format Preprint
id arxiv_https___arxiv_org_abs_2509_12559
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle High-pressure electronic states in semiconductors studied by infrared spectroscopy: metallization and band gap tuning in Mg$_2$Si, InAs and InSb
Okamura, Hidekazu
Okazaki, Haruna
Marugaku, Katsunori
Lee, Subin
Yoneda, Tomoki
Udono, Haruhiko
Mori, Yoshihisa
Maesato, Mitsuhiko
Kitagawa, Hiroshi
Ikemoto, Yuka
Moriwaki, Taro
Materials Science
In this article, a brief introduction is first given on infrared studies of materials at high pressures using a diamond anvil cell. Then, our recent results of high-pressure infrared studies are described for Mg$_2$Si, InAs, and InSb. For Mg$_2$Si, pressure-induced metallization at pressures near 10 GPa were clearly demonstrated for both carrier-doped and undoped Mg$_2$Si by large increases of reflectivity. For InAs and InSb, their band gap ($E_g$) increased rapidly and almost linearly with pressure with linear coefficients of $dE_g/dP$=84.6 and 112 meV/GPa, respectively. Obtained values of $E_g$ versus lattice parameter at high pressures are compared with those for other IIl-V semiconductors at ambient pressure, giving unique insight into effects of physical and chemical pressures on $E_g$. Above the structural transition pressures of 7 and 3 GPa for InAs and InSb, respectively, they exhibit highly metallic characteristics accompanied by high reflectivity.
title High-pressure electronic states in semiconductors studied by infrared spectroscopy: metallization and band gap tuning in Mg$_2$Si, InAs and InSb
topic Materials Science
url https://arxiv.org/abs/2509.12559