Stochastic ion emission perturbation mechanisms in atom probe tomography: Linking simulations to experiment

Fuente: arXiv

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Bibliographic Details
Main Authors:	Shaikh, Aslam, Mäkinen, Tero, Vurpillot, François, Alava, Mikko, Lomakin, Ivan
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.13744