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Radiation damage study of Belle II silicon strip sensors with 90 MeV electron irradiation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Adamczyk, K., Aihara, H., Amos, K., Bacher, S., Bahinipati, S., Baudot, J., Behera, P. K., Bettarini, S., Bosisio, L., Bozek, A., Buchsteiner, F., Casarosa, G., Cheshta, C., Corona, L., Das, S. B., Dujany, G., Finck, C., Forti, F., Friedl, M., Gabrielli, A., Gautam, V., Gobbo, B., Hara, K., Higuchi, T., Irmler, C., Ishikawa, A., Kaleta, M., Kaliyar, A. B., Kang, K. H., Kumar, R., Lalwani, K., Libby, J., Lisovskyi, V., Massaccesi, L., Mohanty, G. B., Mondal, S., Nakamura, K. R., Natkaniec, Z., Onuki, Y., Otani, F., Paladino, A., Raj, V., Ravindran, K., Rehman, J. U., Ripp-Baudot, I., Rizzo, G., Sato, Y., Schwanda, C., Serrano, J., Shimasaki, T., Tanaka, S., Thalmeier, R., Tsuboyama, T., Uematsu, Y., Vitale, L., Wang, S. J., Wang, Z., Wiechczynski, J., Yin, H., Zani, L., Zeng, F.
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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