Hachem, K., Quinsat, Y., Tournier, C., & Beraud, N. (2025). Superellipsoid modeling of wire-laser additive manufacturing defects measured by digital image correlation.
Cita Chicago Style (17a ed.)Hachem, Khalil, Yann Quinsat, Christophe Tournier, y Nicolas Beraud. Superellipsoid Modeling of Wire-laser Additive Manufacturing Defects Measured by Digital Image Correlation. 2025.
Cita MLA (9a ed.)Hachem, Khalil, et al. Superellipsoid Modeling of Wire-laser Additive Manufacturing Defects Measured by Digital Image Correlation. 2025.
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