Tailored Transformation Invariance for Industrial Anomaly Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schönfeld, Mariette, Meert, Wannes, Blockeel, Hendrik
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.17670