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Nanoscale Strain Evolution and Grain Boundary-Mediated Defect Sink Behavior in Irradiated SiC: Insights from N-PED and DFT

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Daghbouj, Nabil, AlMotasem, Ahmed. T., Duchoňb, Jan., Li, Bingsheng., Bensalem, Mohamed., Munnik, Frans., Ou, Xin, Macková, Anna., Weber, William. J., Polcara, Tomas.
Format:	Preprint
Publié:	2025
Sujets:	Materials Science
Accès en ligne:	Acceder al recurso
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