Anomaly Detection by Clustering DINO Embeddings using a Dirichlet Process Mixture

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Schulthess, Nico, Konukoglu, Ender
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2509.19997