Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
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arXiv
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| Main Authors: | Baeuerle, Simon, Khanna, Pratik, Friederich, Nils, Sitcheu, Angelo Jovin Yamachui, Shakirov, Damir, Steimer, Andreas, Mikut, Ralf |
|---|---|
| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | |
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