Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data

Fuente: arXiv
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Bibliographic Details
Main Authors: Baeuerle, Simon, Khanna, Pratik, Friederich, Nils, Sitcheu, Angelo Jovin Yamachui, Shakirov, Damir, Steimer, Andreas, Mikut, Ralf
Format: Preprint
Published: 2025
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