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Defect-Charge-Driven 90° Switching in HfO2

Fuente: arXiv

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Bibliographic Details
Main Authors:	Xie, Muting, Yu, Hongyu, Dai, Zhihao, Wei, Yingfen, Xu, Changsong, Xiang, Hongjun
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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