AI-Enhanced Multi-Dimensional Measurement of Technological Convergence through Heterogeneous Graph and Semantic Learning
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arXiv
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| Auteurs principaux: | , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866918148005953536 |
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| author | Deng, Siming Jia, Runsong Luan, Chunjuan Wu, Mengjia Zhang, Yi |
| author_facet | Deng, Siming Jia, Runsong Luan, Chunjuan Wu, Mengjia Zhang, Yi |
| contents | Technological convergence refers to the phenomenon where boundaries between technological areas and disciplines are increasingly blurred. It enables the integration of previously distinct domains and has become a mainstream trend in today's innovation process. However, accurately measuring technological convergence remains a persistent challenge due to its inherently multidimensional and evolving nature. This study designs an Technological Convergence Index (TCI) that comprehensively measures convergence along two fundamental dimensions: depth and breadth. For depth calculation, we use IPC textual descriptions as the analytical foundation and enhance this assessment by incorporating supplementary patent metadata into a heterogeneous graph structure. This graph is then modeled using Heterogeneous Graph Transformers in combination with Sentence-BERT, enabling a precise representation of knowledge integration across technological boundaries. Complementing this, the breadth dimension captures the diversity of technological fields involved, quantified through the Shannon Diversity Index to measure the variety of technological combinations within patents. Our final TCI is constructed using the Entropy Weight Method, which objectively assigns weights to both dimensions based on their information entropy. To validate our approach, we compare the proposed TCI against established convergence measures, demonstrating its comparative advantages. We further establish empirical reliability through a novel robustness test that regresses TCI against indicators of patent quality. These findings are further substantiated through comprehensive robustness checks. Our multidimensional approach provides valuable practical insights for innovation policy and industry strategies in managing emerging cross-domain technologies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_21187 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | AI-Enhanced Multi-Dimensional Measurement of Technological Convergence through Heterogeneous Graph and Semantic Learning Deng, Siming Jia, Runsong Luan, Chunjuan Wu, Mengjia Zhang, Yi Social and Information Networks Technological convergence refers to the phenomenon where boundaries between technological areas and disciplines are increasingly blurred. It enables the integration of previously distinct domains and has become a mainstream trend in today's innovation process. However, accurately measuring technological convergence remains a persistent challenge due to its inherently multidimensional and evolving nature. This study designs an Technological Convergence Index (TCI) that comprehensively measures convergence along two fundamental dimensions: depth and breadth. For depth calculation, we use IPC textual descriptions as the analytical foundation and enhance this assessment by incorporating supplementary patent metadata into a heterogeneous graph structure. This graph is then modeled using Heterogeneous Graph Transformers in combination with Sentence-BERT, enabling a precise representation of knowledge integration across technological boundaries. Complementing this, the breadth dimension captures the diversity of technological fields involved, quantified through the Shannon Diversity Index to measure the variety of technological combinations within patents. Our final TCI is constructed using the Entropy Weight Method, which objectively assigns weights to both dimensions based on their information entropy. To validate our approach, we compare the proposed TCI against established convergence measures, demonstrating its comparative advantages. We further establish empirical reliability through a novel robustness test that regresses TCI against indicators of patent quality. These findings are further substantiated through comprehensive robustness checks. Our multidimensional approach provides valuable practical insights for innovation policy and industry strategies in managing emerging cross-domain technologies. |
| title | AI-Enhanced Multi-Dimensional Measurement of Technological Convergence through Heterogeneous Graph and Semantic Learning |
| topic | Social and Information Networks |
| url | https://arxiv.org/abs/2509.21187 |