Hysteresis Measurements as a Diagnostic Tool: A Systematic Approach for Stability Benchmarking and Performance Projection of 2D-Materials-Based MOSFETs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Karl, Alexander, Waldhoer, Dominic, Knobloch, Theresia, Verdianu, Axel, Kurzweil, Joël, Bahrami, Mina, Davoudi, Mohammad Rasool, Khakbaz, Pedram, Stampfer, Bernhard, Sattari-Esfahlan, Seyed Mehdi, Illarionov, Yury, Nazir, Aftab, Liu, Changze, Das, Saptarshi, Wang, Xiao Renshaw, Tang, Junchuan, Zhang, Yichi, Tan, Congwei, Li, Ye, Peng, Hailin, Waltl, Michael, Grasser, Tibor
Format:	Preprint
Published:	2025
Subjects:	Applied Physics Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.21315