Real Space Imaging of Spin Scattering in Chirality-Induced Spin Selectivity
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arXiv
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| Auteurs principaux: | , , , , , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866912606237753344 |
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| author | Lee, Jaehyun Lee, Sang-hyuk Jeong, Uiseok Dalayoan, Daryll J. C. Shin, Soobeom Jeong, Hu Young Jin, Hosub Yan, Binghai Park, Noejung Namgung, Seon |
| author_facet | Lee, Jaehyun Lee, Sang-hyuk Jeong, Uiseok Dalayoan, Daryll J. C. Shin, Soobeom Jeong, Hu Young Jin, Hosub Yan, Binghai Park, Noejung Namgung, Seon |
| contents | The interaction between electron spin and molecular chirality plays a fundamental role in quantum phenomena, with significant implications for spintronics and quantum computing. The chirality-induced spin selectivity (CISS) effect, where chiral materials preferentially transmit electrons of a particular spin, has sparked intense interest and debate regarding its underlying mechanism. Despite extensive research, the spatial distribution of spin polarization in chiral systems, the key evidence to reveal the spin scattering mechanism in CISS, has remained experimentally elusive particularly due to complications arising from spin-orbit coupling in metal electrodes typically used in such studies. Here we show, through reflective magnetic circular dichroism measurements on chiral tellurium nanowires with graphene electrodes, that current-induced spin polarization exhibits identical signs in both the nanowire and electrodes, distinct from the presumed spin filter scenario. The observed spin polarization scales linearly with current amplitude, aligns parallel to the current direction, reverses with chirality or current flow, and demonstrates spin relaxation lengths of several micrometers into graphene. Our findings provide the first direct visualization of spatial spin distribution in chiral devices. This work establishes a new paradigm for investigating spin-dependent phenomena in chiral materials and opens avenues for developing chirality-based spintronic and quantum devices. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_21558 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Real Space Imaging of Spin Scattering in Chirality-Induced Spin Selectivity Lee, Jaehyun Lee, Sang-hyuk Jeong, Uiseok Dalayoan, Daryll J. C. Shin, Soobeom Jeong, Hu Young Jin, Hosub Yan, Binghai Park, Noejung Namgung, Seon Mesoscale and Nanoscale Physics Materials Science The interaction between electron spin and molecular chirality plays a fundamental role in quantum phenomena, with significant implications for spintronics and quantum computing. The chirality-induced spin selectivity (CISS) effect, where chiral materials preferentially transmit electrons of a particular spin, has sparked intense interest and debate regarding its underlying mechanism. Despite extensive research, the spatial distribution of spin polarization in chiral systems, the key evidence to reveal the spin scattering mechanism in CISS, has remained experimentally elusive particularly due to complications arising from spin-orbit coupling in metal electrodes typically used in such studies. Here we show, through reflective magnetic circular dichroism measurements on chiral tellurium nanowires with graphene electrodes, that current-induced spin polarization exhibits identical signs in both the nanowire and electrodes, distinct from the presumed spin filter scenario. The observed spin polarization scales linearly with current amplitude, aligns parallel to the current direction, reverses with chirality or current flow, and demonstrates spin relaxation lengths of several micrometers into graphene. Our findings provide the first direct visualization of spatial spin distribution in chiral devices. This work establishes a new paradigm for investigating spin-dependent phenomena in chiral materials and opens avenues for developing chirality-based spintronic and quantum devices. |
| title | Real Space Imaging of Spin Scattering in Chirality-Induced Spin Selectivity |
| topic | Mesoscale and Nanoscale Physics Materials Science |
| url | https://arxiv.org/abs/2509.21558 |