No One-Size-Fits-All: A Workload-Driven Characterization of Bit-Parallel vs. Bit-Serial Data Layouts for Processing-using-Memory

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Jingyao, Sadredini, Elaheh
Format:	Preprint
Published:	2025
Subjects:	Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.22980