Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
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arXiv
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| Main Authors: | , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
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| _version_ | 1866914196523843584 |
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| author | Britton, Ben Zhang, Tianbi |
| author_facet | Britton, Ben Zhang, Tianbi |
| contents | We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters for patterns collected within a map, and then the pattern is shifted and added together. The resultant EBSD-pattern is shown to contain more angular information than a long-exposure single pattern, via 2D Fast Fourier Transform (FFT)-based analysis. In particular, this method has the potential to enhance the scope of small compact direct electron detectors (DEDs). |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_23039 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns Britton, Ben Zhang, Tianbi Instrumentation and Detectors Materials Science We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters for patterns collected within a map, and then the pattern is shifted and added together. The resultant EBSD-pattern is shown to contain more angular information than a long-exposure single pattern, via 2D Fast Fourier Transform (FFT)-based analysis. In particular, this method has the potential to enhance the scope of small compact direct electron detectors (DEDs). |
| title | Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns |
| topic | Instrumentation and Detectors Materials Science |
| url | https://arxiv.org/abs/2509.23039 |