Cover Image

Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Britton, Ben, Zhang, Tianbi
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors Materials Science
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
by: Zhang, Tianbi, et al.
Published: (2024)

AstroECP: towards more practical Electron Channeling Contrast Imaging
by: Qaiser, M. Haroon, et al.
Published: (2025)

Large volume 'chunk' lift out for 3D tomographic analysis using analytical plasma focussed ion beam -- scanning electron microscopy
by: Birch, Ruth, et al.
Published: (2025)

Quantifying the Full Damage Profile of Focused Ion Beams via 4D-STEM Precession Electron Diffraction and PSNR Metrics
by: Masteghin, M. G., et al.
Published: (2025)

In-situ Transmission Kikuchi Diffraction Tensile Testing
by: Vermeij, Tijmen, et al.
Published: (2024)

Open Gas-Cell Transmission Electron Microscopy at 50 pm Resolution
by: Biran, Idan, et al.
Published: (2025)

Noise2Void for Denoising Atomic Resolution Scanning Transmission Electron Microscopy Images
by: Thornley, William, et al.
Published: (2026)

Detective Quantum Efficiency of the Timepix4 Hybrid Pixel Detector and its Application to Parallel-Beam Diffraction
by: Ding, Zhiyuan, et al.
Published: (2026)

The Moving Beam Diffraction Geometry: the DIAD Application of a Diffraction Scanning-Probe
by: Leonardi, Alberto, et al.
Published: (2025)

Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
by: Simonaitis, John W., et al.
Published: (2024)

Methods for an Electron Emission Digital Twin
by: Carceles, Salvador Barranco, et al.
Published: (2026)

Practical Crystallography with a Transmission Electron Microscope
by: Weare, Benjamin L., et al.
Published: (2025)

Scanning Transmission Electron Microscopy of Oxide Interfaces and Heterostructures
by: Spurgeon, Steven R.
Published: (2020)

Achieving Ultrahigh Resolution with High Efficiency: Optical Design of the 2D-RIXS Spectrometer at NanoTerasu BL02U
by: Miyawaki, Jun
Published: (2026)

Deep Learning Enabled Nanoscale X-ray Photoemission Electron Microscopy (nanoXPEEM)
by: Mishra, Aashwin, et al.
Published: (2025)

BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
by: Pattison, Alexander J., et al.
Published: (2024)

Revealing Information from Weak Signal in Electron Energy-Loss Spectroscopy with a Deep Denoiser
by: Wang, Yifan, et al.
Published: (2025)

A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM
by: El-Khairaoui, Nohayla, et al.
Published: (2026)

A Transformer-based Model for Rapid Microstructure Inference from Four-Dimensional Scanning Transmission Electron Microscopy Data
by: Je, Kwanghwi, et al.
Published: (2026)

Electron Emission Channeling for lattice location of radioactive isotopes in single crystals: Improvements from a Timepix3 quad detector and new PyFDD data analysis software
by: David-Bosne, Eric, et al.
Published: (2023)

Point-Spread Function of the Optics in Scanning Electron Microscopes
by: Kamal, Surya, et al.
Published: (2024)

Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration
by: Zhang, Tianbi, et al.
Published: (2026)

Introducing new resonant soft x-ray scattering capability in SSRL
by: Kuo, Cheng-Tai, et al.
Published: (2025)

muT2-NMR: Micro-Scale Correlation Relaxometry for in-situ High-Pressure Nuclear Magnetic Resonance
by: Meier, Thomas, et al.
Published: (2026)

A planning tool for neutron powder diffraction experiments
by: Paddison, Joseph A. M., et al.
Published: (2025)

Liquid Helium Cryogenic TEM below 1 Å
by: Sung, Suk Hyun, et al.
Published: (2025)

Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
by: Ma, Desheng, et al.
Published: (2024)

Three-dimensional imaging of individual carbon atoms
by: Kim, Na Yeon, et al.
Published: (2025)

Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
by: Pelz, Philipp M, et al.
Published: (2022)

Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect
by: Gunawan, Oki, et al.
Published: (2024)

SPARSE -- Efficient High-Resolution SEM Imaging of Rare Microstructural Features Across Large Areas by Selective Rescanning
by: Reclik, Tom, et al.
Published: (2026)

Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
by: Pratiush, Utkarsh, et al.
Published: (2025)

Cathodoluminescence, light injection and EELS in STEM: From comparative to coincidence experiments
by: Tizei, Luiz H. G., et al.
Published: (2025)

Modular Reactor for In Situ X-ray Scattering, Spectroscopy, and ATR-IR Studies of Solvothermal Nanoparticle Synthesis
by: Harouna-Mayer, Sani Y., et al.
Published: (2025)

Advanced structural characterization of single-walled carbon nanotubes with 4D-STEM
by: Louiset, Antonin, et al.
Published: (2025)

Accurate simulations of magnetic excitations in the neutron simulation package McStas
by: Schack, Silas B., et al.
Published: (2025)

Two lock-in amplifiers based $3ω$ technique: a practical guide for thermal conductivity experiments in bulk samples
by: Henriques, Alexandre, et al.
Published: (2025)

High-density and scalable graphene Hall sensor arrays through monolithic CMOS integration
by: Iyer, Vasant, et al.
Published: (2025)

Fast nanothermometry based on direct electron detection of electron backscattering diffraction patterns
by: Gnabasik, Ryan, et al.
Published: (2025)

Poly- and single-crystalline diamond nitrogen-induced TLS losses estimation with superconducting lumped elements micro-resonators
by: Mazzocchi, Francesco, et al.
Published: (2025)