Critique to Verify: Accurate and Honest Test-Time Scaling with RL-Trained Verifiers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yang, Zhicheng, Guo, Zhijiang, Huang, Yinya, Wang, Yongxin, Wang, Yiwei, Liang, Xiaodan, Tang, Jing
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.23152