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Main Authors: Park, Hangil, Seo, Yongmin, Kim, Tae-Kyun
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2509.24448
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author Park, Hangil
Seo, Yongmin
Kim, Tae-Kyun
author_facet Park, Hangil
Seo, Yongmin
Kim, Tae-Kyun
contents Anomaly detection (AD) plays an important role in various real-world applications. Recent advancements in AD, however, are often biased towards industrial inspection, struggle to generalize to broader tasks like semantic anomaly detection and vice versa. Although recent methods have attempted to address general anomaly detection, their performance remains sensitive to dataset-specific settings and single-class tasks. In this paper, we propose a novel dual-model ensemble approach based on knowledge distillation (KD) to bridge this gap. Our framework consists of a teacher and two student models: an Encoder-Decoder model, specialized in detecting patch-level minor defects for industrial AD and an Encoder-Encoder model, optimized for semantic AD. Both models leverage a shared pre-trained encoder (DINOv2) to extract high-quality feature representations. The dual models are jointly learned using the Noisy-OR objective, and the final anomaly score is obtained using the joint probability via local and semantic anomaly scores derived from the respective models. We evaluate our method on eight public benchmarks under both single-class and multi-class settings: MVTec-AD, MVTec-LOCO, VisA and Real-IAD for industrial inspection and CIFAR-10/100, FMNIST and View for semantic anomaly detection. The proposed method achieved state-of-the-art accuracies in both domains, in multi-class as well as single-class settings, demonstrating generalization across multiple domains of anomaly detection. Our model achieved an image-level AUROC of 99.7% on MVTec-AD and 97.8% on CIFAR-10, which is significantly better than the prior general AD models in multi-class settings and even higher than the best specialist models on individual benchmarks.
format Preprint
id arxiv_https___arxiv_org_abs_2509_24448
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spellingShingle Generalist Multi-Class Anomaly Detection via Distillation to Two Heterogeneous Student Networks
Park, Hangil
Seo, Yongmin
Kim, Tae-Kyun
Computer Vision and Pattern Recognition
Anomaly detection (AD) plays an important role in various real-world applications. Recent advancements in AD, however, are often biased towards industrial inspection, struggle to generalize to broader tasks like semantic anomaly detection and vice versa. Although recent methods have attempted to address general anomaly detection, their performance remains sensitive to dataset-specific settings and single-class tasks. In this paper, we propose a novel dual-model ensemble approach based on knowledge distillation (KD) to bridge this gap. Our framework consists of a teacher and two student models: an Encoder-Decoder model, specialized in detecting patch-level minor defects for industrial AD and an Encoder-Encoder model, optimized for semantic AD. Both models leverage a shared pre-trained encoder (DINOv2) to extract high-quality feature representations. The dual models are jointly learned using the Noisy-OR objective, and the final anomaly score is obtained using the joint probability via local and semantic anomaly scores derived from the respective models. We evaluate our method on eight public benchmarks under both single-class and multi-class settings: MVTec-AD, MVTec-LOCO, VisA and Real-IAD for industrial inspection and CIFAR-10/100, FMNIST and View for semantic anomaly detection. The proposed method achieved state-of-the-art accuracies in both domains, in multi-class as well as single-class settings, demonstrating generalization across multiple domains of anomaly detection. Our model achieved an image-level AUROC of 99.7% on MVTec-AD and 97.8% on CIFAR-10, which is significantly better than the prior general AD models in multi-class settings and even higher than the best specialist models on individual benchmarks.
title Generalist Multi-Class Anomaly Detection via Distillation to Two Heterogeneous Student Networks
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2509.24448