DepthLM: Metric Depth From Vision Language Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cai, Zhipeng, Yeh, Ching-Feng, Xu, Hu, Liu, Zhuang, Meyer, Gregory, Lei, Xinjie, Zhao, Changsheng, Li, Shang-Wen, Chandra, Vikas, Shi, Yangyang
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2509.25413