Method for backtracking the layer thermal conductivities of multilayer thin film structure using coupled Newton Raphson approach and 3-omega approach
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arXiv
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866916980340031488 |
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| author | Awenlimobor, Aigbe Xu, Jiajun |
| author_facet | Awenlimobor, Aigbe Xu, Jiajun |
| contents | The thermal conductivity of thin films is commonly estimated using the 3-omega experimental method. When calibrating the test setup, it is customary to use a specimen with a known thermal conductivity for validation. However, when determining the thermal conductivity of samples with unknown values, numerical approximations can provide a means to validate experimental results and ensure the integrity of the setup. A simple analytical or finite element analysis (FEA) method can be used to achieve this. For multilayer systems of unknown layer thermal conductivities, the 3-omega experimental setup only provides information about the overall bulk thermal conductivity of the system. To obtain the individual layer thermal conductivities, a combined experimental and numerical approach can be used. This article presents a novel method for backtracking the layer thermal conductivities of a multilayer thin film structure using a coupled 3-omega experimental and Newton-Raphson numerical approach. The method is validated using high-fidelity data obtained from literature. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2509_26408 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Method for backtracking the layer thermal conductivities of multilayer thin film structure using coupled Newton Raphson approach and 3-omega approach Awenlimobor, Aigbe Xu, Jiajun Computational Physics The thermal conductivity of thin films is commonly estimated using the 3-omega experimental method. When calibrating the test setup, it is customary to use a specimen with a known thermal conductivity for validation. However, when determining the thermal conductivity of samples with unknown values, numerical approximations can provide a means to validate experimental results and ensure the integrity of the setup. A simple analytical or finite element analysis (FEA) method can be used to achieve this. For multilayer systems of unknown layer thermal conductivities, the 3-omega experimental setup only provides information about the overall bulk thermal conductivity of the system. To obtain the individual layer thermal conductivities, a combined experimental and numerical approach can be used. This article presents a novel method for backtracking the layer thermal conductivities of a multilayer thin film structure using a coupled 3-omega experimental and Newton-Raphson numerical approach. The method is validated using high-fidelity data obtained from literature. |
| title | Method for backtracking the layer thermal conductivities of multilayer thin film structure using coupled Newton Raphson approach and 3-omega approach |
| topic | Computational Physics |
| url | https://arxiv.org/abs/2509.26408 |