Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Mao, Wei-Lung, Wang, Chun-Chi, Chou, Po-Heng, Liu, Yen-Ting
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Machine Learning Signal Processing 68T07, 68U10 I.4.8; I.2.10
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.01914