A physics-informed neural network approach to the point defect model for electrochemical oxide film growth

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Farooqi, Mohid, Bösing, Ingmar, Feugmo, Conrard G. Tetsassi
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items