When Higher Resolution Reduces Precision: Quantum Limits of Off-Axis Interferometric Scattering Microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hitzelhammer, Felix, Dong, Jonathan, Hohenester, Ulrich, Juffmann, Thomas
Format:	Preprint
Published:	2025
Subjects:	Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.03034