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Autori principali: Yánez-Parreño, Wilson J., van Schijndel, Teun A. J., McFadden, Anthony P., Ji, Kaixuan, Tan, Susheng, Wu, Yu, Frolov, Sergey, Zollner, Stefan, Simmonds, Raymond W., Palmstrøm, Christopher J.
Natura: Preprint
Pubblicazione: 2025
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Accesso online:https://arxiv.org/abs/2510.05473
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author Yánez-Parreño, Wilson J.
van Schijndel, Teun A. J.
McFadden, Anthony P.
Ji, Kaixuan
Tan, Susheng
Wu, Yu
Frolov, Sergey
Zollner, Stefan
Simmonds, Raymond W.
Palmstrøm, Christopher J.
author_facet Yánez-Parreño, Wilson J.
van Schijndel, Teun A. J.
McFadden, Anthony P.
Ji, Kaixuan
Tan, Susheng
Wu, Yu
Frolov, Sergey
Zollner, Stefan
Simmonds, Raymond W.
Palmstrøm, Christopher J.
contents We explore the molecular beam epitaxy synthesis of superconducting aluminum thin films grown on c-plane sapphire substrates at cryogenic temperatures of 6 K and compare their behavior with films synthesized at room temperature. We demonstrate that cryogenic growth increases structural disorder, producing crystalline grains that modify the optical, electrical, and superconducting properties of aluminum. We observe that cryogenic deposition changes the color of aluminum from fully reflective to yellow and correlate the pseudo-dielectric function and reflectance with structural changes in the film. We find that smaller grain sizes enhance the superconductivity of aluminum, increasing its critical temperature and critical field. We then estimate the superconducting gap and coherence length of Cooper pairs in aluminum in the presence of disorder. Finally, we fabricate superconducting microwave resonators on these films and find that, independently of the growth temperature, the system is dominated by two-level system loss with similar quality factors in the high and low power regimes. We further measure a higher kinetic inductance in the cryogenically grown films.
format Preprint
id arxiv_https___arxiv_org_abs_2510_05473
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Cryogenic growth of aluminum: structural morphology, optical properties, superconductivity and microwave dielectric loss
Yánez-Parreño, Wilson J.
van Schijndel, Teun A. J.
McFadden, Anthony P.
Ji, Kaixuan
Tan, Susheng
Wu, Yu
Frolov, Sergey
Zollner, Stefan
Simmonds, Raymond W.
Palmstrøm, Christopher J.
Superconductivity
Quantum Physics
We explore the molecular beam epitaxy synthesis of superconducting aluminum thin films grown on c-plane sapphire substrates at cryogenic temperatures of 6 K and compare their behavior with films synthesized at room temperature. We demonstrate that cryogenic growth increases structural disorder, producing crystalline grains that modify the optical, electrical, and superconducting properties of aluminum. We observe that cryogenic deposition changes the color of aluminum from fully reflective to yellow and correlate the pseudo-dielectric function and reflectance with structural changes in the film. We find that smaller grain sizes enhance the superconductivity of aluminum, increasing its critical temperature and critical field. We then estimate the superconducting gap and coherence length of Cooper pairs in aluminum in the presence of disorder. Finally, we fabricate superconducting microwave resonators on these films and find that, independently of the growth temperature, the system is dominated by two-level system loss with similar quality factors in the high and low power regimes. We further measure a higher kinetic inductance in the cryogenically grown films.
title Cryogenic growth of aluminum: structural morphology, optical properties, superconductivity and microwave dielectric loss
topic Superconductivity
Quantum Physics
url https://arxiv.org/abs/2510.05473