Cryogenic growth of aluminum: structural morphology, optical properties, superconductivity and microwave dielectric loss

Fuente: arXiv
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Bibliographic Details
Main Authors: Yánez-Parreño, Wilson J., van Schijndel, Teun A. J., McFadden, Anthony P., Ji, Kaixuan, Tan, Susheng, Wu, Yu, Frolov, Sergey, Zollner, Stefan, Simmonds, Raymond W., Palmstrøm, Christopher J.
Format: Preprint
Published: 2025
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