Saved in:
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2510.05903 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866914079589793792 |
|---|---|
| author | Höfer, Sebastian Henning, Dorian Amiranashvili, Artemij Morrison, Douglas Tzes, Mariliza Posner, Ingmar Matvienko, Marc Rennola, Alessandro Milan, Anton |
| author_facet | Höfer, Sebastian Henning, Dorian Amiranashvili, Artemij Morrison, Douglas Tzes, Mariliza Posner, Ingmar Matvienko, Marc Rennola, Alessandro Milan, Anton |
| contents | We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object categories. Existing benchmarks like MVTec-AD [6] and VisA [33] have reached saturation, with state-of-the-art methods achieving up to 99.9% AUROC scores. In contrast to manufacturing, anomaly detection in retail logistics faces new challenges, particularly in the diversity and variability of object pose and appearance. Leading anomaly detection methods fall short when applied to this new setting. To bridge this gap, we introduce a new benchmark that overcomes the current limitations of existing datasets. With over 230,000 images (and more than 29,000 defective instances), it is 40 times larger than MVTec-AD and contains more than 48,000 distinct objects. To validate the difficulty of the problem, we conduct an extensive evaluation of multiple state-of-the-art anomaly detection methods, demonstrating that they do not surpass 56.96% AUROC on our dataset. Further qualitative analysis confirms that existing methods struggle to leverage normal samples under heavy pose and appearance variation. With our large-scale dataset, we set a new benchmark and encourage future research towards solving this challenging problem in retail logistics anomaly detection. The dataset is available for download under https://www.kaputt-dataset.com. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_05903 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Kaputt: A Large-Scale Dataset for Visual Defect Detection Höfer, Sebastian Henning, Dorian Amiranashvili, Artemij Morrison, Douglas Tzes, Mariliza Posner, Ingmar Matvienko, Marc Rennola, Alessandro Milan, Anton Computer Vision and Pattern Recognition Artificial Intelligence Machine Learning We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object categories. Existing benchmarks like MVTec-AD [6] and VisA [33] have reached saturation, with state-of-the-art methods achieving up to 99.9% AUROC scores. In contrast to manufacturing, anomaly detection in retail logistics faces new challenges, particularly in the diversity and variability of object pose and appearance. Leading anomaly detection methods fall short when applied to this new setting. To bridge this gap, we introduce a new benchmark that overcomes the current limitations of existing datasets. With over 230,000 images (and more than 29,000 defective instances), it is 40 times larger than MVTec-AD and contains more than 48,000 distinct objects. To validate the difficulty of the problem, we conduct an extensive evaluation of multiple state-of-the-art anomaly detection methods, demonstrating that they do not surpass 56.96% AUROC on our dataset. Further qualitative analysis confirms that existing methods struggle to leverage normal samples under heavy pose and appearance variation. With our large-scale dataset, we set a new benchmark and encourage future research towards solving this challenging problem in retail logistics anomaly detection. The dataset is available for download under https://www.kaputt-dataset.com. |
| title | Kaputt: A Large-Scale Dataset for Visual Defect Detection |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence Machine Learning |
| url | https://arxiv.org/abs/2510.05903 |