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Automated Neural Architecture Design for Industrial Defect Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Yuxi, Ma, Yunfeng, Tang, Yi, Liu, Min, Jiang, Shuai, Wang, Yaonan
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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