Think Just Enough: Sequence-Level Entropy as a Confidence Signal for LLM Reasoning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sharma, Aman, Chopra, Paras
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.08146