Dominant scattering mechanisms in the low/high electric field transport in cryogenic 2D confinement in Silicon (110) with high-$κ$ oxides

Fuente: arXiv
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Bibliographic Details
Main Authors: Huang, Hsin-Wen, Fang, Xi-Jun, Chen, Edward, Wu, Yuh-Renn
Format: Preprint
Published: 2025
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