Belton, J., & Kong, Z. (2025). There and Back Again: Bulk-to-Defect via Ward Identities.
Chicago Style (17th ed.) CitationBelton, Jake, and Ziwen Kong. There and Back Again: Bulk-to-Defect via Ward Identities. 2025.
MLA (9th ed.) CitationBelton, Jake, and Ziwen Kong. There and Back Again: Bulk-to-Defect via Ward Identities. 2025.
Warning: These citations may not always be 100% accurate.