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Main Authors: Liu, Zheheng, Vigano, Nicola, Proudhon, Henry, Ludwig, Wolfgang
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2510.08712
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author Liu, Zheheng
Vigano, Nicola
Proudhon, Henry
Ludwig, Wolfgang
author_facet Liu, Zheheng
Vigano, Nicola
Proudhon, Henry
Ludwig, Wolfgang
contents Topo-Tomography (TT) is a synchrotron-based X-ray diffraction imaging technique used to characterize grain shape and crystal orientation in polycrystalline samples. This work aims to provide a decisive and fundamental understanding of 3D grain shape and orientation field reconstruction from TT diffraction data. We derive mathematical expressions for the TT projection geometry, considering grain shape, intragranular lattice rotations, and elastic strains, under the assumption of kinematical diffraction. These expressions are simplified using approximations for small strain variations and grain size. The simplified expressions show that integrated TT projection images correspond to projections of a "pseudo" distorted grain volume. Its Fourier analysis provides insights into the feasibility of orientation field reconstruction from TT scans. We propose methods to expand data coverage, including using opposite scattering vectors and varying detector distance. A lower bound for orientation sampling resolution is derived and validated through simulations.
format Preprint
id arxiv_https___arxiv_org_abs_2510_08712
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Theoretical Analysis of Topotomography Using Small Intragranular Strain Approximations
Liu, Zheheng
Vigano, Nicola
Proudhon, Henry
Ludwig, Wolfgang
Computational Physics
Applied Physics
Topo-Tomography (TT) is a synchrotron-based X-ray diffraction imaging technique used to characterize grain shape and crystal orientation in polycrystalline samples. This work aims to provide a decisive and fundamental understanding of 3D grain shape and orientation field reconstruction from TT diffraction data. We derive mathematical expressions for the TT projection geometry, considering grain shape, intragranular lattice rotations, and elastic strains, under the assumption of kinematical diffraction. These expressions are simplified using approximations for small strain variations and grain size. The simplified expressions show that integrated TT projection images correspond to projections of a "pseudo" distorted grain volume. Its Fourier analysis provides insights into the feasibility of orientation field reconstruction from TT scans. We propose methods to expand data coverage, including using opposite scattering vectors and varying detector distance. A lower bound for orientation sampling resolution is derived and validated through simulations.
title Theoretical Analysis of Topotomography Using Small Intragranular Strain Approximations
topic Computational Physics
Applied Physics
url https://arxiv.org/abs/2510.08712