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| Main Authors: | , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2510.08712 |
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| _version_ | 1866912640270336000 |
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| author | Liu, Zheheng Vigano, Nicola Proudhon, Henry Ludwig, Wolfgang |
| author_facet | Liu, Zheheng Vigano, Nicola Proudhon, Henry Ludwig, Wolfgang |
| contents | Topo-Tomography (TT) is a synchrotron-based X-ray diffraction imaging technique used to characterize grain shape and crystal orientation in polycrystalline samples. This work aims to provide a decisive and fundamental understanding of 3D grain shape and orientation field reconstruction from TT diffraction data. We derive mathematical expressions for the TT projection geometry, considering grain shape, intragranular lattice rotations, and elastic strains, under the assumption of kinematical diffraction. These expressions are simplified using approximations for small strain variations and grain size. The simplified expressions show that integrated TT projection images correspond to projections of a "pseudo" distorted grain volume. Its Fourier analysis provides insights into the feasibility of orientation field reconstruction from TT scans. We propose methods to expand data coverage, including using opposite scattering vectors and varying detector distance. A lower bound for orientation sampling resolution is derived and validated through simulations. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_08712 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Theoretical Analysis of Topotomography Using Small Intragranular Strain Approximations Liu, Zheheng Vigano, Nicola Proudhon, Henry Ludwig, Wolfgang Computational Physics Applied Physics Topo-Tomography (TT) is a synchrotron-based X-ray diffraction imaging technique used to characterize grain shape and crystal orientation in polycrystalline samples. This work aims to provide a decisive and fundamental understanding of 3D grain shape and orientation field reconstruction from TT diffraction data. We derive mathematical expressions for the TT projection geometry, considering grain shape, intragranular lattice rotations, and elastic strains, under the assumption of kinematical diffraction. These expressions are simplified using approximations for small strain variations and grain size. The simplified expressions show that integrated TT projection images correspond to projections of a "pseudo" distorted grain volume. Its Fourier analysis provides insights into the feasibility of orientation field reconstruction from TT scans. We propose methods to expand data coverage, including using opposite scattering vectors and varying detector distance. A lower bound for orientation sampling resolution is derived and validated through simulations. |
| title | Theoretical Analysis of Topotomography Using Small Intragranular Strain Approximations |
| topic | Computational Physics Applied Physics |
| url | https://arxiv.org/abs/2510.08712 |