Tight Robustness Certificates and Wasserstein Distributional Attacks for Deep Neural Networks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Le, Bach C., Dao, Tung V., Nguyen, Binh T., Chu, Hong T. M.
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Optimization and Control
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.10000