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| Main Authors: | , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2510.11461 |
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Table of Contents:
- As artificial intelligence (AI) chips become more powerful, the thermal management capabilities of conventional silicon (Si) substrates become insufficient for 3D-stacked designs. This work integrates electrically insulative and thermally conductive hexagonal boron nitride (h-BN) interposers into AI chips for effective thermal management. Using COMSOL Multiphysics, the effects of High-Bandwidth Memory (HBM) distributions and thermal interface material configurations on heat dissipation and hotspot mitigation were studied. A 20 °C reduction in hot spots was achieved using h-BN interposers compared to Si interposers. Such an improvement could reduce AI chips' power leakage by 22% and significantly enhance their thermal performance.