Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection

Fuente: arXiv
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Main Authors: Auad, Yves, Castioni, Florian, Baaboura, Jassem, Bézard, Malo, Blazit, Jean-Denis, Li, Xiaoyan, Teutrie, Adrien, Walls, Michael, Stéphan, Odile, Tizei, Luiz H. G., de La Peña, Francisco, Kociak, Mathieu
Format: Preprint
Published: 2025
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author Auad, Yves
Castioni, Florian
Baaboura, Jassem
Bézard, Malo
Blazit, Jean-Denis
Li, Xiaoyan
Teutrie, Adrien
Walls, Michael
Stéphan, Odile
Tizei, Luiz H. G.
de La Peña, Francisco
Kociak, Mathieu
author_facet Auad, Yves
Castioni, Florian
Baaboura, Jassem
Bézard, Malo
Blazit, Jean-Denis
Li, Xiaoyan
Teutrie, Adrien
Walls, Michael
Stéphan, Odile
Tizei, Luiz H. G.
de La Peña, Francisco
Kociak, Mathieu
contents Direct electron detection is revolutionizing electron microscopy by offering lower noise, reduced point-spread function, and increased quantum efficiency. Among these advancements, the Timepix3 hybrid-pixel direct electron detector stands out for its unique ability to output temporal information about individual hits within its pixel array. Its event-based architecture enables data-driven detection, where individual events are immediately read out from the chip. While recent studies have demonstrated the potential of event-based detectors in various applications in the context of continuous-gun scanning transmission electron microscopes (STEM), the use of such detectors with standard scanning units remains underdeveloped. In this work, we present a custom-designed, Timepix3-compatible scanning unit specifically developed to leverage the advantages of event-based detection. We explore its performance in enabling spatially and temporally resolved experiments, as well as its seamless interfacing with other time-resolved instruments, such as pulsed lasers and electron beam blankers. Additionally, we examine the prospects for achieving enhanced temporal resolution in time-resolved experiments using continuous-gun electron microscopes, identifying key challenges and proposing solutions to improve performance. This combination of custom hardware with advanced detection technology promises to expand the capabilities of electron microscopy in both fundamental research and practical applications.
format Preprint
id arxiv_https___arxiv_org_abs_2510_11612
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection
Auad, Yves
Castioni, Florian
Baaboura, Jassem
Bézard, Malo
Blazit, Jean-Denis
Li, Xiaoyan
Teutrie, Adrien
Walls, Michael
Stéphan, Odile
Tizei, Luiz H. G.
de La Peña, Francisco
Kociak, Mathieu
Instrumentation and Detectors
Direct electron detection is revolutionizing electron microscopy by offering lower noise, reduced point-spread function, and increased quantum efficiency. Among these advancements, the Timepix3 hybrid-pixel direct electron detector stands out for its unique ability to output temporal information about individual hits within its pixel array. Its event-based architecture enables data-driven detection, where individual events are immediately read out from the chip. While recent studies have demonstrated the potential of event-based detectors in various applications in the context of continuous-gun scanning transmission electron microscopes (STEM), the use of such detectors with standard scanning units remains underdeveloped. In this work, we present a custom-designed, Timepix3-compatible scanning unit specifically developed to leverage the advantages of event-based detection. We explore its performance in enabling spatially and temporally resolved experiments, as well as its seamless interfacing with other time-resolved instruments, such as pulsed lasers and electron beam blankers. Additionally, we examine the prospects for achieving enhanced temporal resolution in time-resolved experiments using continuous-gun electron microscopes, identifying key challenges and proposing solutions to improve performance. This combination of custom hardware with advanced detection technology promises to expand the capabilities of electron microscopy in both fundamental research and practical applications.
title Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection
topic Instrumentation and Detectors
url https://arxiv.org/abs/2510.11612