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Hauptverfasser: An, Yulin, Zhao, Xueqi, del Castillo, Enrique
Format: Preprint
Veröffentlicht: 2025
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Online-Zugang:https://arxiv.org/abs/2510.11740
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author An, Yulin
Zhao, Xueqi
del Castillo, Enrique
author_facet An, Yulin
Zhao, Xueqi
del Castillo, Enrique
contents We present a new method for the statistical process control of lattice structures using tools from Topological Data Analysis. Motivated by applications in additive manufacturing, such as aerospace components and biomedical implants, where hollow lattice geometries are critical, the proposed framework is based on monitoring the persistent homology properties of parts. Specifically, we focus on homological features of dimensions zero and one, corresponding to connected components and one-dimensional loops, to characterize and detect changes in the topology of lattice structures. A nonparametric hypothesis testing procedure and a control charting scheme are introduced to monitor these features during production. Furthermore, we conduct extensive run-length analysis via various simulated but real-life lattice-structured parts. Our results demonstrate that persistent homology is well-suited for detecting topological anomalies in complex geometries and offers a robust, intrinsically geometrical alternative to other SPC methods for mesh and point data.
format Preprint
id arxiv_https___arxiv_org_abs_2510_11740
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Monitoring 3D Lattice Structures in Additive Manufacturing Using Topological Data Analysis
An, Yulin
Zhao, Xueqi
del Castillo, Enrique
Methodology
Applications
We present a new method for the statistical process control of lattice structures using tools from Topological Data Analysis. Motivated by applications in additive manufacturing, such as aerospace components and biomedical implants, where hollow lattice geometries are critical, the proposed framework is based on monitoring the persistent homology properties of parts. Specifically, we focus on homological features of dimensions zero and one, corresponding to connected components and one-dimensional loops, to characterize and detect changes in the topology of lattice structures. A nonparametric hypothesis testing procedure and a control charting scheme are introduced to monitor these features during production. Furthermore, we conduct extensive run-length analysis via various simulated but real-life lattice-structured parts. Our results demonstrate that persistent homology is well-suited for detecting topological anomalies in complex geometries and offers a robust, intrinsically geometrical alternative to other SPC methods for mesh and point data.
title Monitoring 3D Lattice Structures in Additive Manufacturing Using Topological Data Analysis
topic Methodology
Applications
url https://arxiv.org/abs/2510.11740